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Semiconductor devices. Constant current electromigration test Ingestion-build-156411 dynamic or internal stresses)
Semiconductor devices. Constant current electromigration test Ingestion-build-156411 dynamic or internal stresses)
$142.00
Description
dynamic or internal stresses)
Shape and size
Specifically Part 12 of BS EN ISO 10993 addresses:
(Note that the categories L1 to L7 include 2-
Negative-sequence voltage superimposed onto the terminal voltage of rotating machines can produce additional heat losses
Semiconductor devices. Constant current electromigration test Ingestion-build-156411 dynamic or internal stresses)1 Scope This standard describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
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