Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories Ingestion-build-209208 Where this is not practicable

Where this is not practicable test pieces may be cut from sheet material

manufacture and construction and drawing conventions relating to modular coordination are described in appendix A

and address OH&S management system nonconformities associated with its activities

Performance available from samples formatted according to a standard interchange format (SIF)

An example of identification of processes in a manufacturing business

Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories Ingestion-build-209208 Where this is not practicable