Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation of thin film transistor characteristics on flexible substrates under bulging Ingestion-build-78747 Gives testing procedures for the

Gives testing procedures for the measurement of interoperable performance

Annex A (normative) External thread – Calculation of stress area

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ISO 14064‑1 includes requirements and guidance on inventory quality management

- Engineering service installation rooms

Semiconductor devices. Flexible and stretchable semiconductor devices - Evaluation of thin film transistor characteristics on flexible substrates under bulging Ingestion-build-78747 Gives testing procedures for theWhat is this standard about? This part of IEC 62951 specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly distributed pressure to the flexible substrate using the equipment.