T01600 - SEMI T16 - Specification for Use of Data Matrix Symbology for Automated Identification of Extreme Ultraviolet Lithography Masks StdTpc-Glass Wafer Current edition approved by the
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Description
Current edition approved by the North American Regional Standards Committee on August 28
This Safety Guideline provides guidance for the safety evaluation of load ports and wafer handling robots before integration
エンドエフェクタ排除領域 †
It is not intended to distinguish good from bad or desirable from undesirable
Figure 1은 GEM
T01600 - SEMI T16 - Specification for Use of Data Matrix Symbology for Automated Identification of Extreme Ultraviolet Lithography Masks StdTpc-Glass Wafer Current edition approved by theThis Specification provides a symbology for marking hard surface extreme ultraviolet (EUV) masks. This Specification defines the geometric and spatial relationships and content (including error checking and correcting code) of square two dimensional, machine readable, Data Matrix symbols for pattern surface marking of resist coated 6 inch EUV masks that comply with, or extrapolate from, the specifications of SEMI P37 and SEMI P38. This Specification
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