D02200 - SEMI D22 - 平面顯示螢幕(FPD)彩色濾光片總成顏色透光度計算之測試法 Revision:SEMI D22-1103 - Superseded ARAMS defines concepts

ARAMS defines concepts

This Standard specifies the measurement method for recombination lifetime in epilayer of silicon epitaxial wafer (epitaxial wafer

9%フッ化ケイ素酸（10:1 V/V）に対して要求が認められたグレードのガイドラインも示す。ガイドラインの場合は，試験方法は統計的に有効となっていない場合がある。

3  Values given for thickness

and reliability

D02200 - SEMI D22 - 平面顯示螢幕(FPD)彩色濾光片總成顏色透光度計算之測試法 Revision:SEMI D22-1103 - Superseded ARAMS defines concepts1. 1 (FPD) 2. 1 FPD 2. 2 FPD This test method was technically approved by the global Flat Panel Display Committee and is the direct responsibility of the Japanese Flat Panel Display Committee. Current edition approved by the Japanese Regional Standards Committee on August 8, 2003. Initially available at www. semi. org October 2003; to be published November 2003. Originally published September 1999. NOTICE: This document was completely rewritten in