JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working System Sub-Assembly: Beam Focus Stage

System Sub-Assembly: Beam Focus Stage

Inventory # 19407

Part Numbers: 2S017-450

5080-192750-12: X-AXIS

Model No: EP200Mmd

JEOL Secondary Electron Detector JWS-2000 Wafer Defect Review SEM Working System Sub-Assembly: Beam Focus StageJEOL Secondary Electron Detector JWS 2000 Wafer Defect Review SEM Working Part No: Secondary Electron Detector Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 12"x12"x12" @ 3 lbs. Only items