JEOL Column Mechanical Lens Assembly JWS-2000 Wafer Defect Review SEM Working Removed from a Nikon NSR-S307E

Removed from a Nikon NSR-S307E DUV Scanning System BMU Unit Installed Component

Part No: 0021-20823

Part No: 02-152265-00

Inventory # CONJ-2030

Cutler-Hammer LGE3630NN Industrial Circuit Breaker L630E ELLBN3400W AMAT Working

JEOL Column Mechanical Lens Assembly JWS-2000 Wafer Defect Review SEM Working Removed from a Nikon NSR-S307EJEOL Column Mechanical Lens Assembly JWS 2000 Wafer Defect Review SEM Working Inventory # CONF 1320 Part No: Column Mechanical Lens Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Mechanical Lens Assembly JWS 2000 Wafer Defect Review SEM is used working surplus. Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but