G07900 - SEMI G79 - Specification for Overall Digital Timing Accuracy Revision:SEMI G79-0200 - Inactive as technology advances to smaller

as technology advances to smaller and smaller dimensions for the elements of high density integrated circuits

The purpose of this Document is to provide guidelines for organosilicate precursors used in Low K CVD processes and to standardize testing procedures to support those requirements

or gaseous source

A brief description of the theory of this Test Method is given in Related Information 1

This safety guideline identifies preferred methods for the protection of persons from safety and health hazards as they perform work on or around equipment used for semiconductor or FPD manufacturing

G07900 - SEMI G79 - Specification for Overall Digital Timing Accuracy Revision:SEMI G79-0200 - Inactive as technology advances to smallerThis Standard was technically approved by the global Automated Test Equipment Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on December 24, 2011. Available at www. semiviews. org and www. semi. org in May 2012; originally published February 2000. This Standard is intended to provide a minimum common definition of timing accuracy specifications for semiconductor automatic test equipment