Material Market Data Subscription (MMDS) StdPbc-0925 Reduce the attraction of particles

Reduce the attraction of particles to charged surfaces

1  This Guide is intended in general for metrology on low stiffness substrates like wafers or other geometrical shapes such as panels

SEMI MF1763-0706 (Reapproved 1111)

but the precision estimate was taken from data on chemical-mechanical polished surfaces

SEMI E51 — Guide for Typical Facilities Services and Termination Matrix

Material Market Data Subscription (MMDS) StdPbc-0925 Reduce the attraction of particlesQuarterly global semiconductor materials report covering 10 years of historical revenue and a 2 year forecast. Report contains 10 types of wafer fab materials and 7 types of packaging materials. Includes a BONUS report: Photomask Characterization Summary Data presented in Microsoft Excel.